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Texplorer™ CORE

Machine vision inspection software for defect detection in (technical) textiles and other surfaces

COMVIS Texplorer™ CORE is the most powerful machine vision inspection software in the industry, specifically designed for automatic defect detection and measurement tasks in (technical) textiles. This includes woven, non-woven, knitted, UD fabrics, and other continuous surfaces. The software employs a wide range of state-of-the-art image processing algorithms to detect deviations on the surface and edges of flat continuous materials, as well as to perform typical measurement tasks such as determining width, thickness, length, and shape.

Texplorer™ CORE is a hardware-independent platform, enabling us to quickly adapt to the rapid developments in camera technology, illumination, computing hardware, and other machine vision components. It supports both line-scan and area-scan camera. Your application and product specifications determine the most suitable hardware, in combination with our software suite, to meet your inspection needs. The result is a flexible, high-performance, state-of-the-art vision inspection system tailored to your evolving requirements.

Inspection modules

Texplorer™ CORE offers a comprehensive list of modular inspection modules designed to meet a wide range of detection and measurement tasks in fabrics. All inspection modules can perform their tasks simultaneously or asynchronously.
Abbreviation Category Module Description
ED Edge Texplorer™ CORE Edge Detection Static based edge detection module suitable for fixed edges or automatic detection of fabric edges that determine the ROI of the other inspection modules.
EA Edge Texplorer™ CORE Edge Anomalies Static based edge inspection module suitable for detection of absolute or relative edge anomalies.
EF Edge Texplorer™ CORE Edge Filaments Static based edge inspection module suitable for detection of single or multiple edge filamentation.
FE Edge Texplorer™ CORE Folding Edges Static based edge inspection module suitable for detection of folded fabric edges.
TXI Surface Texplorer™ CORE TXI Surface inspection algorithm based on static filters. Suitable for weaving defects and texture differences. Not sensitive for vertical appearing striping.
TXII Surface Texplorer™ CORE TXII Surface inspection algorithm based on Fast Fourier Transform (FFT) analysis. Suitable for low contrast stains and spots.
TXIII Surface Texplorer™ CORE TXIII Edge Learning and reference based surface inspection suitable for all kinds of defects that deviate from the automatically learned dynamic trained model.
HV Surface Texplorer™ CORE Horizontal Vertical Static surface inspection based on projection suitable for all kinds of (low contrast) horizontal or vertical appearing deviations, such as warp- and weft defects, creases or folds.
AVG Surface Texplorer™ CORE AVG Reference based surface inspection module suitable for detection of absolute or relative gray scale value differences in the surface in comparison with its reference.
SF Surface Texplorer™ CORE Surface Filaments Static based surface inspection module suitable for detection of surface filamentation.
SA Surface Texplorer™ CORE Surface Anamolies Static based surface inspection module suitable for detection of surface anomalies.
AI Surface Texplorer™ CORE AI Deep learning-based anomaly detection module using global context anomaly detection.
TD Measurement Texplorer™ CORE Thickness Detection Static surface inspection module suitable for measuring absolute or relative thickness differences.
WD Measurement Texplorer™ CORE Width Detection Static based width measurement module suitable for measuring absolute or relative width differences based on the found edges in either physical or virtual cameras.
BOW Measurement Texplorer™ CORE Bow Static based surface inspection module suitable for detection of displacement of filling yarns (weft) that appear as bows
BIAS Measurement Texplorer™ CORE Bias Static based surface inspection module suitable for detection of displacement of filling yarns (weft) from being not perpendicular (skewed) to the selvage (warp) in the fabric.

Standard features

Illumination settings

Depending on your Profiler™ or VIU™ inspection system configuration, a range of dimmable and/or strobe configurable LED-illumination sources is available. The output power of each illumination type can be precisely configured and is stored within the inspection parameters. Upon loading the corresponding recipe, the system automatically sets the illumination intensities to the predefined levels, ensuring consistent and repeatable lighting conditions optimized for your specific inspection task

Scalable platform & central management

The platform is scalable and extendable to multiple workstations and an infinite number of connected cameras that can be synchronized with each other. This enables managing large or complex inspection systems, where all connected workstations and cameras are centrally managed and controlled. Through the Texplorer Manager, configurations, inspection parameters, and user defined fields can be easily deployed and synchronized across all stations, ensuring consistent inspection results, efficient coordination, and simplified operation of the entire system.

Front-End/Back-End service

A dedicated front-end/back-end service is available to enable seamless integration with third-party systems. This interface allows Texplorer™ CORE to communicate efficiently with (external) automation platforms, production monitoring systems, and data processing tools.

Supported communication protocols and data formats include:

  • Modbus – for industrial control and PLC integration,

  • MQTT – for lightweight messaging in IoT environments,

  • OPC UA – for standardized industrial data exchange,

  • XML – for structured data exchange with external software,

  • API – for flexible and direct system-level integration.

This makes it easy to exchange inspection results, alarms, system status, and configuration settings with MES, SCADA, ERP, or custom software platforms—ensuring smooth interoperability and real-time data access across your production environment.

Defect examples

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