Texplorer™ CORE

Machine vision inspection software for defect detection in (technical) textiles and other surfaces

COMVIS Texplorer™ CORE is the industry’s most powerful machine vision inspection software platform, dedicated for automatic defect detection of (technical) textiles. For instance woven, non woven, knitted fabrics and other surfaces. It is using a variety of state of the art image processing algorithms for detection of deviations in the surface and edges of flat continuous goods.

Texplorer™ CORE is a hardware independent platform, allowing us to directly anticipate on the fast changing developments in the market of cameras, illumination, computer technology and other machine vision components and peripherals. It is suitable for both line scan as well as area scan cameras. Your application and product determines what hardware we use, not the other way around! This results in flexible, state of the art, high performance vision inspection systems based on your ever growing needs.

Inspection modules

Available inspection modules within the Texplorer™ CORE inspection software
Abbreviation Category Module Description
ED Edge Texplorer™ CORE Edge Detection Static based edge detection module suitable for fixed edges or automatic detection of fabric edges that determine the ROI of the other inspection modules.
EA Edge Texplorer™ CORE Edge Anomalies Static based edge inspection module suitable for detection of absolute or relative edge anomalies.
EF Edge Texplorer™ CORE Edge Filaments Static based edge inspection module suitable for detection of single or multiple edge filamentation.
FE Edge Texplorer™ CORE Folding Edges Static based edge inspection module suitable for detection of folded fabric edges.
TXI Surface Texplorer™ CORE TXI Surface inspection algorithm based on static filters. Suitable for weaving defects and texture differences. Not sensitive for vertical appearing striping.
TXII Surface Texplorer™ CORE TXII Surface inspection algorithm based on Fast Fourier Transform (FFT) analysis. Suitable for low contrast stains and spots.
TXIII Surface Texplorer™ CORE TXIII Reference based surface inspection suitable for all kinds of defects that deviate from the automatically learned dynamic trained model.
HV Surface Texplorer™ CORE Horizontal Vertical Static surface inspection based on projection suitable for all kinds of (low contrast) horizontal or vertical appearing deviations, such as warp- and weft defects, creases or folds.
AVG Surface Texplorer™ CORE AVG Reference based surface inspection module suitable for detection of absolute or relative gray scale value differences in the surface in comparison with its reference.
SF Surface Texplorer™ CORE Surface Filaments Static based surface inspection module suitable for detection of surface filamentation.
SA Surface Texplorer™ CORE Surface Anamolies Static based surface inspection module suitable for detection of surface anomalies.
AI Surface Texplorer™ CORE AI Deep learning-based anomaly detection module using global context anomaly detection, used in addition to the above mentioned modules.
TD Measurement Texplorer™ CORE Thickness Detection Static surface inspection module suitable for measuring absolute or relative thickness differences.
WD Measurement Texplorer™ CORE Width Detection Static based width measurement module suitable for measuring absolute or relative width differences based on the found edges in either physical or virtual cameras.
BOW Measurement Texplorer™ CORE Bow Static based surface inspection module suitable for detection of displacement of filling yarns (weft) that appear as bows
BIAS Measurement Texplorer™ CORE Bias Static based surface inspection module suitable for detection of displacement of filling yarns (weft) from being not perpendicular (skewed) to the selvage (warp) in the fabric.

Standard features

Inspection modules

Texplorer™ CORE consists of a wide range of inspection modules, each with its own specific inspection task. They can be used simultaneously. The material is therefore inspected at once for all possible deviations. Inspection modules include modules for detection of warp and weft defects, modules for holes, stains, knots. Modules based on static image processing or based on a trained reference, using deep learning / AI. Modules for edge filament detection, edge deviations, width measurements, thickness measurements, surface filaments, bow & bias measurements or shade variation recognition. It is all available within one and the same software environment.

Illumination settings

Depending on your Profiler™ or VIU™ inspection system configuration, a variety of dimmable illuminations are at your disposal. The configurable output power of the illumination is saved within your inspection settings and automatically set when loading the applicable recipe.

Camera settings

Configure your cameras’ gain and/or exposure and save the settings in your recipe. Sync your settings to all connected cameras in your configuration at once, or make separate settings per camera.

User Defined Fields

Use the User Defined Fields to save specific information with your inspection sessions, such as Article nr., Batch nr., Customer codes, Roll nr., Operator nr., etc. UDF is also available when interfacing with third party systems over OPC/UA, Modbus or MQTT.

Edge detection

Texplorer™ CORE automatically detects the edge or an edge transition of your webbing, fabric or other (industrial) surface. Regardless of the characteristics of the edge; woven, cut, serrated, etc. The edge module can be configured in such a way that consistent edge detection is achieved. An important condition for either consistent surface defect inspection as well as accurate width measurements.

Interfacing with Texplorer™ CORE

Load recipes, start and stop inspection sessions, fill out user defined fields in Texplorer™ CORE over a third party PLC and/or HMI using OPC/UA, Modbus or MQTT.

Infinite vision setup variations

Use 1 high-resolution camera and divide the camera image into virtual ends, or stitch 12 physical cameras together to generate 1 virtual image. All combinations are possible. The application determines the ideal hardware setup, so you do not have to compromise on optimal inspection results because you are bound to a standard.

Inspection sessions

Each inspection run results in a folder with inspection session information, including high resolution defect images and inspection data. Our high-resolution defect images also provide important context of the defect environment. This makes detected defects more recognizable, easy to trace and easy to cluster.

Defect examples

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