Use the session manager to select the protocol you’d like to review. The session manager shows all roll protocols from all connected VIU™ or Profiler™ inspection systems in your plant. Sort on date, length, quality, session, recipe, or user defined fields (like piece numbers, batch numbers, production numbers, etc.)

Via the Quick Search you can quickly find the protocol you are looking for, by searching on unique roll identidication, like piece numbers, batch numbers, production numbers or recipes.

Preconfigure a filter to filter out short inspection sessions, bad quality rolls or protocols that have already been reviewed by an operator and keep your session manager organized.

Quickly reset protocols, delete protocols, refresh tables or even generate reports without the necessity to open the protocol.

View the defect distribution in a graphical presentation in the defect map. The defect map is responsive in running direction (Y-axis) with infinite zoom. Size and color of the defect circles indicate size and type of the defect in the defect map, as well as the X- and Y-position in the protocol based both absolute and relative coordinates.

Individual defects are automatically grouped based on intuitive and configurable filters and conditions, set by the customer. Grouped defects are called clusters and are automatically graded based on severity.

Annotation and severity of automatic clusters can be manually overruled to make individual decisions if considered necessary.

Classification of defects, or annotations, is carried out per cluster, based on customer specific conditions and severity.

The maximum amount of defects can be set over a specific material length. Defects below set threshold are displayed in green, when exceeding the maximum value it appears as a red bar. The Quality Graph is an easy to use tool for the manager or operator to quickly see if the maximum amount of defects per X meter is exceeded.

Invert your protocol when the end of your roll during inspection is the beginning of the roll during unwinding / cutting process.

Choose to enable or disable the defect overlay that informs about defect position and size

The magnifier automatically zooms in on the defect position in the high resolution image, showing the defect without the defect overlay information.

Individual defect information including X/Y, size, timestamp, severity, class, etc.